beamlab SCAN CONTROLLER
DAC80502 / DUAL 16-BIT

Place the beam.
One precise step at a time.

A dedicated X/Y command board for the ESP32, synchronized with the LMC662 specimen-current detector. The scan amplifiers use a shared, buffered 1.25 V center.

01 / ELECTRICAL CONNECTIONS

From digital coordinates to plate voltage.

NEW LOW-VOLTAGE MODULE · REV A

The DAC board stays outside vacuum. Its X/Y outputs connect to the external differential scan amplifiers; the LMC662 detector remains on its separate board.

AIR / SHIELDED CONTROL ELECTRONICSVACUUM ESP32SCLK18 / SDIN23SYNC27 · BLANK25 DAC80502A / B · 0–2.5 V16-bit paired update SPI Clean 3.3 V + decoupling Buffered midpointACAS network → OPA3332.5 V reference÷ 2 + filter X / Y amplifiersExternal · selectGain 100 assumed X DAC / J2.1Y DAC / J2.3 1.25 V center / J2.5 4 feedthrough wires GPIO25 → J1.6 → J3.1 / external blanking interfaceBeam blanker Shared signal ground · J2.2 / J2.4 / J2.6 · chamber and enclosures retain their earth bondDifferential plate voltage= A × (VDAC − Vcenter)No beam-HV connectionto the DAC module
Scan board connectorConnect to
J1.1 / J1.2Clean 3.3 V input / signal ground
J1.3 / J1.4 / J1.5ESP32 GPIO18 SCLK / GPIO23 SDIN / GPIO27 SYNC
J1.6 → J3.1GPIO25 → external active-high blank request; J3.2 ground
J2.1 / J2.3X / Y amplifier command inputs
J2.5Buffered 1.25 V center → both amplifier reference inputs
J2.2 / J2.4 / J2.6Signal ground alongside each analog output
02 / POSITIONING ≠ IMAGE RESOLUTION

See what the extra bits change.

Changing gain here represents changing the physical scan amplifier. This calculator is independent of your saved run.

Nominal step / code
Scanned field width
Requested raster spacing
Distinct raster positions

Formula, derivation & sources

ΔVDAC = VFS / 2ᴺ. Subtracting the center and amplifying gives ΔVplates = A × ΔVDAC. The ideal plate sensitivity is S = eL(D + L/2)/(gpv), so Δx = S × ΔVplates. Here L = 20 mm, D = 15 mm and g = 10 mm; p and v use relativistic beam energy. The raster includes both endpoints: requested spacing is field width / (pixels − 1).

DAC80502 uses 65,536 intervals, with code 65,535 one interval below full scale. These are nominal values; noise, nonlinearity, offsets, gain error, drift, fringing and beam blur require separate characterization.

TI transfer equation ↗ · OpenStax electric force ↗ · JEOL probe-size limits ↗
03 / NATIVE DESIGN FILES

A separate board for the scan commands.

UNBUILT PROTOTYPE
DAC80502 scan module PCB top view

The module contains the dual DAC, decoupling, matched midpoint divider, OPA333 buffer, output isolation resistors and blank-request pull-up. Its WSON DAC needs reflow assembly.

External scan amplifiers are still to be selected. Passed CAD checks establish connectivity and layout rules; they do not establish measured scan accuracy.

04 / BRING-UP ORDER

Check position commands before scanning.

  1. Inspect and power the module. Keep the beam blanked. Verify 3.3 V input and the firmware configuration before connecting the external drivers.
  2. Initialize while blanked. SPI mode 1 at 1 MHz; CONFIG = 0x0000, GAIN = 0x0103, SYNC = 0x0003. Write A/B midpoint code 32768, then software LDAC (TRIGGER = 0x0010). Allow 100 ms after configuration for the reference and center circuit to settle.
  3. Measure the low-voltage outputs. After initialization, code 32768 should be near 1.25 V. Test 16384 and 49152 near 0.625 V and 1.875 V. Allow warm-up, then measure the center under its real load; calibrate offset and gain. The low-cost matched network does not guarantee 16-bit midpoint accuracy.
  4. Check the complete driver chain. With gain 100 and a ±20 V differential scan, the DAC spans about 1.05–1.45 V. Verify polarity, voltage range, paired updates, noise and settling at the actual plate load. The board does not supply plate-drive voltages.
  5. Acquire with the current detector. Keep the existing 5 ms beam-on settling and 10 ms acquisition window initially. Record the blanked zero with z; s starts and x stops/blanks. Compare repeat scans before pursuing finer features.