beamlabSimple electron microscopeV4.1
Base v1 ↗ LOCAL SIMULATION
CONNECTED INSTRUMENT / SPECIMEN CURRENT 04

Your instrument. In motion.

Choose your parts. Shape the beam. Watch the fields respond.

Choose a starting setupYour previous parameters are preserved.

Instrument controls

LIVE
01 / ELECTRON GUN

A source of electrons

A tungsten filament, a negative cathode, and a grounded anode.

Estimated filament temperature— K
Steady-state thermal model · illustrative filament
i

Heating sets emission. Acceleration voltage sets electron energy. The heater floats at cathode potential.

BEAM ON
Primary e⁻ Emitted SE / BSE
100%
Schematic · representative electrons · motion slowed
FIELD STRENGTH fixed scales
0B ≥ 40 mT / scan & aperture E ≥ 20 kV/m
Gun E: 0 → 500 kV/mFringe shapes qualitative
COMPONENT EXPLORERInside the columnSelect a component to inspect it. Double-click to zoom.
THE NUMBERS BEHIND THE BEAM

Physics, as you change it.

Hover, focus, or select an equation for its derivation, assumptions, and original sources.

Imaging preset loaded. All controls are interactive.SIMULATION TIME 0.0 s
SEVEN WAYS TO EXPLORE A SCAN

Choose your next specimen.

Ideal synthetic previews, before beam blur and detector noise. Select a pattern to scan it with your current settings.

Dimensions describe the generated patterns. Biological forms are illustrative; material yields, charging and feature depth are not predicted. Use “Fit sample” in the scan panel to center a specimen at its suggested field width.

WELCOME TO BEAM LAB 04

Pick up where you left off.

Your base version and previous parameters are preserved. Choose how this run should start.

Your last setup

Loading saved parameters…

PRESERVED
REPRODUCIBLE EXPERIMENTS

Save this setup.

Store the specimen, all parameters and the current scan code for a future run.

Edit BOM row